Electrostatic Substrate Clamping For Next Generation Semiconductor Devices

First Serial Rights, (c) 1999, Robert Widas - April 21

Introduction
Types
Monopole
Bipolar
Tripole
Multi-polar
Materials
Anodized Aluminum
Aluminum Nitride
Polyimide
Ceramic
Flame spray
Johnsen-Rahbek
Issues
Clamping
Thermal Characteristics
RF Effects
Trouble-shooting
Goals

Introduction (c) 1999, Robert Widas - April 21 #38744
Electrostatic clamping is widely used on single substrate process equipment in the semiconductor industry. In this article we will discuss the different configurations, materials, and troubleshooting of Electrostatic chucks "ESC's".
The evolution from mechanically clamped systems to ESC type systems was predicated by device real estate, device yield and particle issues.

  1. Device real estate was lost around the edge of the substrate which was in physical contact with the mechanical clamp, this area is protected from the process during clamping.
  2. Device yield was impacted due to the lack of thermal control on a mechanically clamped system. The substrate would bow in the center due to the gas pressure under the substrate. This resulted in uneven RF delivery, and process results (uniformity). Domed electrodes were necessary to increase the RF performance and heat transfer characteristics of the mechanically clamped system. The ESC is a flat surface which clamps the substrate to the ESC uniformly. This permits maximum heat transfer due to increased contact area between the substrate and ESC. The introduction of a backside gas increases the heat transfer characteristics of the ESC.
  3. Particles were introduced onto the substrate as a result of mechanical clamp movement over the substrate surface. It also resulted in device side contact with the substrate. This routinely resulted in particle transport to the substrate.

Monopole
An ESC is basically a capacitor, see Figure 1 for an example of a monopole ESC and a capacitor, the two are similar. There are two plates with a dielectric between them. The lower plate can be considered the metal mounting for the dielectric. The dielectric is the insulating material between the two plates. The upper plate in this configuration is the substrate. In Figure 1 the lower plate is connected to a DC power supply. The ESC charges equal and opposite signs across the dielectric to the substrate. The substrate will be securely clamped to the dielectric when there is a return path for the ESC power supply. The normal mode of operation for a monopole ESC is for the electrode to be connected to the negative pole of the power supply. The substrate is connected through the plasma to ground. This implies that the substrate is not securely clamped prior to exposing the substrate to the plasma or other return path.

a monopolar example

Bipolar
In the bipolar configuration the ESC can clamp the substrate irrespective of a plasma. The return path is through the other pole of the ESC. Figure 2 illustrates a simple bipolar arrangement. This configuration uses the positive and negative potential of the power supply to Electro-statically clamp the substrate.

a bipolar example

Tri-polar
A tri-polar ESC contains three poles. The inner two poles are similar to the bipolar configuration, and are used to clamp the substrate. The outer pole can be used as either a plasma shield or a substrate bias pickup point.

Multi-pole
Multi-pole ESC's use either AC or DC that is phased to each pole of the electrode. The phasing of the voltage applied to the electrode permits "rapid clamping and release". The supply and control circuitry required for this type of ESC is more complicated than the monopole, bipolar or Tripole configurations. The multi-pole configuration is used to minimize charge build up on the substrate and also helps reduce de-clamping issues.

Anodized
The anodized aluminum ESC is used in plasma and deposition systems where the net voltage delivered to the RF powered ESC is < 700 volts. The dielectric breakdown of the anodized aluminum is dependent on the thickness of the dielectric. A coating of 1 mil thickness experiences breakdown between 250 and 890 volts. This wide window is the result of the different process steps performed during manufacture. All ESC process information by the manufacturers is considered proprietary and will not be discussed in this article. A listing of ESC suppliers is included at the end of this article. The dielectric constant of anodized aluminum is 9-10.

Aluminum Nitride
Aluminum Nitride is used in high temperature process environments. It's thermal conductivity is similar to Aluminum. The dielectric constant is approximately 10 which is slightly higher than the Anodized materials. The dielectric strength is rated at 305 volts per mil. The Aluminum Nitride ESC is more expensive than the other types.

Polyimide
Polyimide films have been used successfully for electrical isolation. This permits these films to be used in ESC's. The material is available in various thickness'. The Polyimide can be applied over a metal plate to form a capacitor to the substrate. The Polyimide has a dielectric constant of 3.4 . The breakdown voltage for the Polyimide coating is rated at 560 volts per mil.

Ceramic
Ceramic ESC's are thin plates of Alumina Oxide that has been fired and ground flat. These plates are generally much thicker than their anodized counterparts. Most ceramic ESC's are thicker than 4 mils. The problem with ceramic ESC's is the large voltage necessary to clamp a substrate across the larger dielectric thickness. This large voltage creates problems when it comes time to release the substrate, and with perceived device damage. The ceramic ESC's transfer less heat than their Anodized counterparts.

Flame spray
The flame-spray technique has gained renewed interest lately due to its ease of application and its potential for customizing the performance of the ESC. The flame-spray technique uses a "D" gun to ignite and sputter deposit ceramic material on a surface. The material can be doped to control the Johnsen-Rahbek effect. This type of dielectric manufacture is being tested in semiconductor applications and results to date indicate it will successfully meet device manufacturer requirements.

Johnsen-Rahbek
The ceramic is doped to control its resistivity to a specific value. The doping causes the ceramic to exhibit the Johnsen-Rahbek effect. This effect permits the ESC to be charged at a high voltage. This high voltage charging step drives the charge towards one end of the dielectric. This reduces the effective distance between the plates. The result is an increase in the capacitance due to a decrease in the distance between the plates. The ESC can then be cycled to a lower voltage for substrate processing. This gives increased clamping over a non-doped device. The constraint on this type of clamping is that the dielectric is severely polarized after the high voltage charging step. In order to release a substrate reliably the ESC voltage potential needs to be reversed to redistribute the charge throughout the dielectric.

Clamping
Substrate clamping is a function of the quality of the capacitor. The standard formula for a capacitor is C=(A*K*Eo)/d where C = capacitance, A = area of the surface, K = the dielectric constant of the material, Eo = permittivity of free space, and d = the thickness of the dielectric. The capacitance can be raised by increasing the area, or the dielectric constant. It can also be increased by reducing d.
The force applied to the substrate is a function of F=(C*V2)/(2*d).
V = the voltage applied to the electrode. The force can be increased by increasing the voltage or the capacitance. The voltage will have a much large effect on the force due to the squared term.
The pressure the ESC should clamp to is a function of P=F/A. From this equation it seems evident that whatever increases the force increases the substrate release pressure.
The clamping of the ESC can be measured in a variety of ways. Our preferred way of measuring the substrate release time is to introduce a controlled pressure behind the substrate. The leak rate between the substrate and ESC is measured to determine when the substrate has been released.

Thermal Characteristics
The main advantage an ESC has over mechanically clamped systems is its substrate temperature control. The ESC is flat and the substrate conforms to the flat surface finish much better than clamped systems with domed electrodes. The ESC applies a uniform force against the substrate surface as opposed to maintaining pressure around the outer edge of the substrate as in mechanically clamped systems. Heat transfer is a combination of conduction, convection, and radiation for the ESC. Testing has indicated that without a backside gas the heat transfer is severely limited. This will result in uneven substrate temperature distribution, device heating, and possible yield loss. The backside gas fills the voids between the ESC and substrate. The heat transfer increases as the pressure of the backside gas is increased.

RF Effects
In high frequency RF environments the substrate gains a net negative charge due to the bias buildup on the electrode. This negative charge on the substrate reduces the force "F" applied during clamping over any negatively charged area. This reduction in charge must be compensated for in order to maintain a consistent pressure of cooling gas on the backside of the substrate. Different techniques are used to compensate for this substrate bias.
Older systems employed an offset voltage equal to the substrate voltage, or so they believed. The limitation to a fixed voltage is that most production machines run various recipes. The offset can only be adjusted optimally for one recipe. All others will fluctuate around this voltage.
A newer concept called bias compensation varies the voltage on the negative pole. This voltage corresponds to the negative pole ESC voltage plus whatever bias voltage is built up on the substrate.

Trouble-shooting

Goals for Next Generation Devices in Terms of Substrate Performance

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